Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip

Nonfiction, Science & Nature, Technology, Electronics, Circuits
Cover of the book Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip by Marvin Onabajo, Jose Silva-Martinez, Springer New York
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Author: Marvin Onabajo, Jose Silva-Martinez ISBN: 9781461422969
Publisher: Springer New York Publication: March 8, 2012
Imprint: Springer Language: English
Author: Marvin Onabajo, Jose Silva-Martinez
ISBN: 9781461422969
Publisher: Springer New York
Publication: March 8, 2012
Imprint: Springer
Language: English

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.   

  • Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
  • Includes built-in testing techniques, linked to current industrial trends;
  • Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
  • Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.
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This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.   

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