Analog IC Reliability in Nanometer CMOS

Nonfiction, Science & Nature, Technology, Electronics, Circuits
Cover of the book Analog IC Reliability in Nanometer CMOS by Elie Maricau, Georges Gielen, Springer New York
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Author: Elie Maricau, Georges Gielen ISBN: 9781461461630
Publisher: Springer New York Publication: January 11, 2013
Imprint: Springer Language: English
Author: Elie Maricau, Georges Gielen
ISBN: 9781461461630
Publisher: Springer New York
Publication: January 11, 2013
Imprint: Springer
Language: English

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

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This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

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