Applied Creep Mechanics

Nonfiction, Science & Nature, Technology, Material Science, Engineering, Industrial, Mechanical
Cover of the book Applied Creep Mechanics by Wei Sun, Thomas H. Hyde, Christopher J. Hyde, McGraw-Hill Education
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Wei Sun, Thomas H. Hyde, Christopher J. Hyde ISBN: 9780071828703
Publisher: McGraw-Hill Education Publication: October 6, 2013
Imprint: McGraw-Hill Education Language: English
Author: Wei Sun, Thomas H. Hyde, Christopher J. Hyde
ISBN: 9780071828703
Publisher: McGraw-Hill Education
Publication: October 6, 2013
Imprint: McGraw-Hill Education
Language: English

Complete coverage of design and life assessment methods for high-temperature components

Applied Creep Mechanics fully discusses the time-dependent deformation which occurs in a metal when subjected to stress at an elevated temperature. This book explains how to perform detailed analyses of welded components; assess the conditions under which cracks may initiate and grow; and extract valuable information about the current state of the material, which may have been in service for many years.

This practical guide provides tested techniques for improving the design and life assessment methods for high-temperature components in power plants, chemical plants, and aero engines. The information presented in this book will help you optimize maintenance and repair, save time, reduce costs, and improve operational efficiency.

  • Provides real-world industrial perspective on how to apply techniques to practical problems
  • Case studies with linear and non-linear material behavior models
  • Solution methods based on equilibrium compatibility and stress-strain and energy concepts
  • Discusses high-temperature creep of engineering components; high-temperature structural analysis; high-temperature fracture mechanics; and damage mechanics
  • Covers welded, notched, and cracked components
  • State-of-the-art coverage of thermo-mechanical fatigue (TMF)
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Complete coverage of design and life assessment methods for high-temperature components

Applied Creep Mechanics fully discusses the time-dependent deformation which occurs in a metal when subjected to stress at an elevated temperature. This book explains how to perform detailed analyses of welded components; assess the conditions under which cracks may initiate and grow; and extract valuable information about the current state of the material, which may have been in service for many years.

This practical guide provides tested techniques for improving the design and life assessment methods for high-temperature components in power plants, chemical plants, and aero engines. The information presented in this book will help you optimize maintenance and repair, save time, reduce costs, and improve operational efficiency.

More books from McGraw-Hill Education

Cover of the book The Illustrated Guide to Technical Analysis Signals and Phrases by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book Chasing Daylight:How My Forthcoming Death Transformed My Life by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book The Warrior’s Character: Leadership Wisdom From West Point’s Cadet Prayer by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book The Art of Bank M&A: Buying, Selling, Merging, and Investing in Regulated Depository Institutions in the New Environment by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book Optics Demystified by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book Millionaire Real Estate Agent - Success in Good Times and Bad (EBOOK BUNDLE) by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book History of Chinese Ancient Educational Thought (Works by Zhu Yongxin on Education Series) by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book Users' Guides to the Medical Literature: Essentials of Evidence-Based Clinical Practice 3e by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book Transients in Electrical Systems: Analysis, Recognition, and Mitigation by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book How to Do Everything BlackBerry Storm2 by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book Oxorn Foote Human Labor and Birth, Sixth Edition by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book McGraw-Hill Education SSAT/ISEE, Fifth Edition by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book McGraw-Hill Education TEAS Review by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book CMOS Nanoelectronics: Analog and RF VLSI Circuits by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
Cover of the book How to Measure Training Results by Wei Sun, Thomas H. Hyde, Christopher J. Hyde
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy