Alberto Bosio: 1 book
Advanced Test Methods for SRAMs
Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Language: English
Release Date: October 8, 2009
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the...
