by
Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar
Language: English
Release Date: March 10, 2015
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The...