Masashi Horiguchi: 1 book
by Masashi Horiguchi, Kiyoo Itoh
Language: English
Release Date: January 11, 2011
Language: English
Release Date: January 11, 2011
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as...
