Thin Film and Nanostructure Texture Analysis
by
Gwo-Ching Wang, Toh-Ming Lu
Language: English
Release Date: December 11, 2013
This unique book covers the fundamental principle of electron diffraction, basic instrumentation of RHEED, definitions of textures in thin films and nanostructures, mechanisms and control of texture formation, and examples of RHEED transmission mode measurements of texture and texture evolution of...