Patrick Echlin: 1 book

Book cover of Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
by Patrick Echlin
Language: English
Release Date: April 14, 2011

Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed...
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