Basic and Advanced Applications
by
Pavel G. Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko
Language: English
Release Date: March 20, 2017
This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-resonance-based methods: electron spin echo,...