Philippe Pougnet: 1 book

Book cover of Nanometer-scale Defect Detection Using Polarized Light
by Philippe Pougnet, Abdelkhalak El Hami, Pierre-Richard Dahoo
Language: English
Release Date: August 16, 2016

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis...
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