T Mitch Wallis: 1 book

Book cover of Measurement Techniques for Radio Frequency Nanoelectronics
by T. Mitch Wallis, Pavel Kabos
Language: English
Release Date: September 14, 2017

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting...
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