Von G Samedi: 1 book

Book cover of Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features
by Von G. Samedi, Thèrése Bocklage
Language: English
Release Date: September 22, 2016

This book provides cytopathologists a succinct but comprehensive reference covering common diagnostic dilemmas caused by normal, iatrogenic, inflammatory and reactive/reparative changes in cytology samples. This book will provide immediate access to these confounders, clearly illustrating key features...
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