Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Nonfiction, Science & Nature, Technology, Electronics, Circuits
Cover of the book Built-in-Self-Test and Digital Self-Calibration for RF SoCs by Sleiman Bou-Sleiman, Mohammed Ismail, Springer New York
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Author: Sleiman Bou-Sleiman, Mohammed Ismail ISBN: 9781441995483
Publisher: Springer New York Publication: September 23, 2011
Imprint: Springer Language: English
Author: Sleiman Bou-Sleiman, Mohammed Ismail
ISBN: 9781441995483
Publisher: Springer New York
Publication: September 23, 2011
Imprint: Springer
Language: English

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 

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