Cluster Secondary Ion Mass Spectrometry

Principles and Applications

Nonfiction, Science & Nature, Science, Chemistry, Analytic
Cover of the book Cluster Secondary Ion Mass Spectrometry by Christine M. Mahoney, Wiley
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Christine M. Mahoney ISBN: 9781118589243
Publisher: Wiley Publication: April 17, 2013
Imprint: Wiley Language: English
Author: Christine M. Mahoney
ISBN: 9781118589243
Publisher: Wiley
Publication: April 17, 2013
Imprint: Wiley
Language: English

Explores the impact of the latest breakthroughs in cluster SIMS technology

Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method.

With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include:

  • Cluster SIMS theory and modeling
  • Cluster ion source types and performance expectations
  • Cluster ion beams for surface analysis experiments
  • Molecular depth profiling and 3-D analysis with cluster ion beams
  • Specialty applications ranging from biological samples analysis to semiconductors/metals analysis
  • Future challenges and prospects for cluster SIMS

This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Explores the impact of the latest breakthroughs in cluster SIMS technology

Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method.

With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include:

This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.

More books from Wiley

Cover of the book Golf All-in-One For Dummies by Christine M. Mahoney
Cover of the book The Law of Higher Education, A Comprehensive Guide to Legal Implications of Administrative Decision Making by Christine M. Mahoney
Cover of the book Analytical and Numerical Methods for Vibration Analyses by Christine M. Mahoney
Cover of the book The Escape Manifesto by Christine M. Mahoney
Cover of the book 50 Ways to a Better You For Dummies, Mini Edition by Christine M. Mahoney
Cover of the book What is Politics? by Christine M. Mahoney
Cover of the book The Tax Law of Charitable Giving, 2017 Supplement by Christine M. Mahoney
Cover of the book Show Your Work by Christine M. Mahoney
Cover of the book Mediated Cosmopolitanism by Christine M. Mahoney
Cover of the book Next Generation HALT and HASS by Christine M. Mahoney
Cover of the book Business Plans Kit For Dummies by Christine M. Mahoney
Cover of the book A Companion to Russian Cinema by Christine M. Mahoney
Cover of the book ABC of Kidney Disease by Christine M. Mahoney
Cover of the book Contributions to Modern and Ancient Tidal Sedimentology by Christine M. Mahoney
Cover of the book Stahlbau-Kalender 2019 - Schwerpunkt by Christine M. Mahoney
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy