Compact Models and Measurement Techniques for High-Speed Interconnects

Nonfiction, Computers, Advanced Computing, Programming, Logic Design, Science & Nature, Technology, Electronics, Circuits
Cover of the book Compact Models and Measurement Techniques for High-Speed Interconnects by Rohit Sharma, Tapas Chakravarty, Springer New York
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Author: Rohit Sharma, Tapas Chakravarty ISBN: 9781461410713
Publisher: Springer New York Publication: February 17, 2012
Imprint: Springer Language: English
Author: Rohit Sharma, Tapas Chakravarty
ISBN: 9781461410713
Publisher: Springer New York
Publication: February 17, 2012
Imprint: Springer
Language: English

Compact Models and Measurement Techniques for High-Speed Interconnects provides detailed analysis of issues related to high-speed interconnects from the perspective of modeling approaches and measurement techniques. Particular focus is laid on the unified approach (variational method combined with the transverse transmission line technique) to develop efficient compact models for planar interconnects. This book will give a qualitative summary of the various reported modeling techniques and approaches and will help researchers and graduate students with deeper insights into interconnect models in particular and interconnect in general. Time domain and frequency domain measurement techniques and simulation methodology are also explained in this book.

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Compact Models and Measurement Techniques for High-Speed Interconnects provides detailed analysis of issues related to high-speed interconnects from the perspective of modeling approaches and measurement techniques. Particular focus is laid on the unified approach (variational method combined with the transverse transmission line technique) to develop efficient compact models for planar interconnects. This book will give a qualitative summary of the various reported modeling techniques and approaches and will help researchers and graduate students with deeper insights into interconnect models in particular and interconnect in general. Time domain and frequency domain measurement techniques and simulation methodology are also explained in this book.

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