Digital Holography for MEMS and Microsystem Metrology

Nonfiction, Science & Nature, Technology, Electronics, Microelectronics
Cover of the book Digital Holography for MEMS and Microsystem Metrology by Anand Asundi, Wiley
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Anand Asundi ISBN: 9781119972785
Publisher: Wiley Publication: July 5, 2011
Imprint: Wiley Language: English
Author: Anand Asundi
ISBN: 9781119972785
Publisher: Wiley
Publication: July 5, 2011
Imprint: Wiley
Language: English

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes.

  • Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies.
  • Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications.
  • Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging.
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes.

More books from Wiley

Cover of the book Conversations with Marketing Masters by Anand Asundi
Cover of the book Atlas of Small Animal Wound Management and Reconstructive Surgery by Anand Asundi
Cover of the book Chemical Process Retrofitting and Revamping by Anand Asundi
Cover of the book Practical Public Health Nutrition by Anand Asundi
Cover of the book Secrets of a Serial Entrepreneur by Anand Asundi
Cover of the book Manual of Clinical Paramedic Procedures by Anand Asundi
Cover of the book Clinical Anaesthesia by Anand Asundi
Cover of the book Freesourcing by Anand Asundi
Cover of the book Built to Grow by Anand Asundi
Cover of the book Practical Statistics for Environmental and Biological Scientists by Anand Asundi
Cover of the book TouchPoints by Anand Asundi
Cover of the book The Irresistible Offer by Anand Asundi
Cover of the book Illustrator CS4 For Dummies by Anand Asundi
Cover of the book Organometallic Compounds of Low-Coordinate Si, Ge, Sn and Pb by Anand Asundi
Cover of the book Protest in Putin's Russia by Anand Asundi
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy