Electron Nano-Imaging

Basics of Imaging and Diffraction for TEM and STEM

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science
Cover of the book Electron Nano-Imaging by Nobuo Tanaka, Springer Japan
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Nobuo Tanaka ISBN: 9784431565024
Publisher: Springer Japan Publication: April 4, 2017
Imprint: Springer Language: English
Author: Nobuo Tanaka
ISBN: 9784431565024
Publisher: Springer Japan
Publication: April 4, 2017
Imprint: Springer
Language: English

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

More books from Springer Japan

Cover of the book Theory of Semiconductor Lasers by Nobuo Tanaka
Cover of the book Agent-Based Approaches in Economic and Social Complex Systems VI by Nobuo Tanaka
Cover of the book The Cricket as a Model Organism by Nobuo Tanaka
Cover of the book Mathematical and Computational Analyses of Cracking Formation by Nobuo Tanaka
Cover of the book Integrated Studies of Social and Natural Environmental Transition in Laos by Nobuo Tanaka
Cover of the book Development of New Catalytic Performance of Nanoporous Metals for Organic Reactions by Nobuo Tanaka
Cover of the book Aortopathy by Nobuo Tanaka
Cover of the book Advances in Mathematical Economics Volume 18 by Nobuo Tanaka
Cover of the book The Myanmar Economy by Nobuo Tanaka
Cover of the book Stochastic Control Theory by Nobuo Tanaka
Cover of the book Confronting Emerging Zoonoses by Nobuo Tanaka
Cover of the book Behçet's Disease by Nobuo Tanaka
Cover of the book Intestinal Anisakiasis in Japan by Nobuo Tanaka
Cover of the book Practical Acoustic Emission Testing by Nobuo Tanaka
Cover of the book Beyond Global Capitalism by Nobuo Tanaka
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy