Electronics Reliability and Measurement Technology

Nondestructive Evaluation

Nonfiction, Science & Nature, Technology, Technical & Manufacturing Industries & Trades, Engineering, Mechanical
Cover of the book Electronics Reliability and Measurement Technology by Joseph S. Heyman, Elsevier Science
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Author: Joseph S. Heyman ISBN: 9780815517009
Publisher: Elsevier Science Publication: December 31, 1998
Imprint: William Andrew Language: English
Author: Joseph S. Heyman
ISBN: 9780815517009
Publisher: Elsevier Science
Publication: December 31, 1998
Imprint: William Andrew
Language: English

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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