Fundamentals of Electromigration-Aware Integrated Circuit Design

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Advanced Computing, Engineering, Computer Architecture
Cover of the book Fundamentals of Electromigration-Aware Integrated Circuit Design by Jens Lienig, Matthias Thiele, Springer International Publishing
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Author: Jens Lienig, Matthias Thiele ISBN: 9783319735580
Publisher: Springer International Publishing Publication: February 23, 2018
Imprint: Springer Language: English
Author: Jens Lienig, Matthias Thiele
ISBN: 9783319735580
Publisher: Springer International Publishing
Publication: February 23, 2018
Imprint: Springer
Language: English

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.

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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.

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