Fundamentals of Sum-Frequency Spectroscopy

Nonfiction, Science & Nature, Science, Physics, Optics, Technology
Cover of the book Fundamentals of Sum-Frequency Spectroscopy by Y. R. Shen, Cambridge University Press
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Author: Y. R. Shen ISBN: 9781316472057
Publisher: Cambridge University Press Publication: February 18, 2016
Imprint: Cambridge University Press Language: English
Author: Y. R. Shen
ISBN: 9781316472057
Publisher: Cambridge University Press
Publication: February 18, 2016
Imprint: Cambridge University Press
Language: English

The first book on the topic, and written by the founder of the technique, this comprehensive resource provides a detailed overview of sum-frequency spectroscopy, its fundamental principles, and the wide range of applications for surfaces, interfaces, and bulk. Beginning with an overview of the historical context, and introductions to the basic theory of nonlinear optics and surface sum-frequency generation, topics covered include discussion of different experimental arrangements adopted by researchers, notes on proper data analysis, an up-to-date survey commenting on the wide range of successful applications of the tool, and a valuable insight into current unsolved problems and potential areas to be explored in the future. With the addition of chapter appendices that offer the opportunity for more in-depth theoretical discussion, this is an essential resource that integrates all aspects of the subject and is ideal for anyone using, or interested in using, sum-frequency spectroscopy.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

The first book on the topic, and written by the founder of the technique, this comprehensive resource provides a detailed overview of sum-frequency spectroscopy, its fundamental principles, and the wide range of applications for surfaces, interfaces, and bulk. Beginning with an overview of the historical context, and introductions to the basic theory of nonlinear optics and surface sum-frequency generation, topics covered include discussion of different experimental arrangements adopted by researchers, notes on proper data analysis, an up-to-date survey commenting on the wide range of successful applications of the tool, and a valuable insight into current unsolved problems and potential areas to be explored in the future. With the addition of chapter appendices that offer the opportunity for more in-depth theoretical discussion, this is an essential resource that integrates all aspects of the subject and is ideal for anyone using, or interested in using, sum-frequency spectroscopy.

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