Hot Carrier Degradation in Semiconductor Devices

Nonfiction, Science & Nature, Technology, Electronics, Circuits
Cover of the book Hot Carrier Degradation in Semiconductor Devices by , Springer International Publishing
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Author: ISBN: 9783319089942
Publisher: Springer International Publishing Publication: October 29, 2014
Imprint: Springer Language: English
Author:
ISBN: 9783319089942
Publisher: Springer International Publishing
Publication: October 29, 2014
Imprint: Springer
Language: English

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices.  Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. 

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices.  Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. 

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