Introduction to Quantum Metrology

Quantum Standards and Instrumentation

Nonfiction, Science & Nature, Science, Other Sciences, Weights & Measures, Nanostructures
Cover of the book Introduction to Quantum Metrology by Waldemar Nawrocki, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Waldemar Nawrocki ISBN: 9783319156699
Publisher: Springer International Publishing Publication: March 24, 2015
Imprint: Springer Language: English
Author: Waldemar Nawrocki
ISBN: 9783319156699
Publisher: Springer International Publishing
Publication: March 24, 2015
Imprint: Springer
Language: English

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.

More books from Springer International Publishing

Cover of the book China’s Grand Strategy by Waldemar Nawrocki
Cover of the book Pattern Recognition by Waldemar Nawrocki
Cover of the book The Rise and Fall of Korea’s Economic Development by Waldemar Nawrocki
Cover of the book Ultrafast Phenomena in Molecular Sciences by Waldemar Nawrocki
Cover of the book Introduction to Surgery for Students by Waldemar Nawrocki
Cover of the book Electrical Machines and Drives by Waldemar Nawrocki
Cover of the book Children and Screen Media in Changing Arab Contexts by Waldemar Nawrocki
Cover of the book Embodied Carbon in Buildings by Waldemar Nawrocki
Cover of the book Proceedings of the Second International Afro-European Conference for Industrial Advancement AECIA 2015 by Waldemar Nawrocki
Cover of the book Metadata and Semantic Research by Waldemar Nawrocki
Cover of the book Precision Interferometry in a New Shape by Waldemar Nawrocki
Cover of the book Models and Theories in Social Systems by Waldemar Nawrocki
Cover of the book Viruses, Genes, and Cancer by Waldemar Nawrocki
Cover of the book Security Protocols XXII by Waldemar Nawrocki
Cover of the book Foundations of Embedded Systems by Waldemar Nawrocki
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy