Life-Cycle Assessment of Semiconductors

Nonfiction, Science & Nature, Technology, Electronics, Semiconductors
Cover of the book Life-Cycle Assessment of Semiconductors by Sarah B. Boyd, Springer New York
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Sarah B. Boyd ISBN: 9781441999887
Publisher: Springer New York Publication: October 12, 2011
Imprint: Springer Language: English
Author: Sarah B. Boyd
ISBN: 9781441999887
Publisher: Springer New York
Publication: October 12, 2011
Imprint: Springer
Language: English

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.

More books from Springer New York

Cover of the book Modern Infectious Disease Epidemiology by Sarah B. Boyd
Cover of the book How James Watt Invented the Copier by Sarah B. Boyd
Cover of the book The Rise of Fetal and Neonatal Physiology by Sarah B. Boyd
Cover of the book Women’s Health in Interventional Radiology by Sarah B. Boyd
Cover of the book The Innovation Butterfly by Sarah B. Boyd
Cover of the book Frozen Section Library: Lymph Nodes by Sarah B. Boyd
Cover of the book The Earth as a Distant Planet by Sarah B. Boyd
Cover of the book Understanding and Controlling Crime by Sarah B. Boyd
Cover of the book Pocket Guide to Critical Care Pharmacotherapy by Sarah B. Boyd
Cover of the book Integration of Functional Oxides with Semiconductors by Sarah B. Boyd
Cover of the book New Perspectives on Industrial Organization by Sarah B. Boyd
Cover of the book An Introduction to Traffic Flow Theory by Sarah B. Boyd
Cover of the book Next Generation Sequencing by Sarah B. Boyd
Cover of the book Data-driven Generation of Policies by Sarah B. Boyd
Cover of the book Community Disaster Vulnerability by Sarah B. Boyd
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy