Measurement and Modeling of Silicon Heterostructure Devices

Nonfiction, Science & Nature, Technology, Electronics, Circuits
Cover of the book Measurement and Modeling of Silicon Heterostructure Devices by John D. Cressler, CRC Press
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: John D. Cressler ISBN: 9781351834766
Publisher: CRC Press Publication: October 3, 2018
Imprint: CRC Press Language: English
Author: John D. Cressler
ISBN: 9781351834766
Publisher: CRC Press
Publication: October 3, 2018
Imprint: CRC Press
Language: English

When you see a nicely presented set of data, the natural response is: “How did they do that; what tricks did they use; and how can I do that for myself?” Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data.

Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

When you see a nicely presented set of data, the natural response is: “How did they do that; what tricks did they use; and how can I do that for myself?” Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data.

Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters.

More books from CRC Press

Cover of the book Design of Fishways and Other Fish Facilities by John D. Cressler
Cover of the book Experimental Hydraulics: Methods, Instrumentation, Data Processing and Management by John D. Cressler
Cover of the book Total Purchasing by John D. Cressler
Cover of the book Imaging Through Turbulence by John D. Cressler
Cover of the book GlobalSoilMap - Digital Soil Mapping from Country to Globe by John D. Cressler
Cover of the book Protobiology Physical Basis Of Biology by John D. Cressler
Cover of the book Image Processing and Data Analysis with ERDAS IMAGINE® by John D. Cressler
Cover of the book Beyond Command and Control by John D. Cressler
Cover of the book Real Estate and GIS by John D. Cressler
Cover of the book Statistical Thermodynamics Of Surfaces, Interfaces, And Membranes by John D. Cressler
Cover of the book The Ergonomics Of Workspaces And Machines by John D. Cressler
Cover of the book Handbook of Electronic Package Design by John D. Cressler
Cover of the book Chlorophyll Fluorescence by John D. Cressler
Cover of the book Short Bowel Syndrome by John D. Cressler
Cover of the book Sensitive Security Information, Certified® (SSI) Body of Knowledge by John D. Cressler
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy