Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

Nonfiction, Science & Nature, Technology, Microwaves, Material Science
Cover of the book Metal Impurities in Silicon- and Germanium-Based Technologies by Cor Claeys, Eddy Simoen, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Cor Claeys, Eddy Simoen ISBN: 9783319939254
Publisher: Springer International Publishing Publication: August 13, 2018
Imprint: Springer Language: English
Author: Cor Claeys, Eddy Simoen
ISBN: 9783319939254
Publisher: Springer International Publishing
Publication: August 13, 2018
Imprint: Springer
Language: English

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed.

 

The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed.

 

The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

More books from Springer International Publishing

Cover of the book Artificial Intelligence in Label-free Microscopy by Cor Claeys, Eddy Simoen
Cover of the book Principles and Practice of Constraint Programming by Cor Claeys, Eddy Simoen
Cover of the book Neighbourhood Policy and the Construction of the European External Borders by Cor Claeys, Eddy Simoen
Cover of the book Law and Regulation of Air Cargo by Cor Claeys, Eddy Simoen
Cover of the book Redox Homeostasis in Plants by Cor Claeys, Eddy Simoen
Cover of the book Exercise for Aging Adults by Cor Claeys, Eddy Simoen
Cover of the book Artificial Intelligence Applications and Innovations by Cor Claeys, Eddy Simoen
Cover of the book Vegetation Survey and Classification of Subtropical Forests of Southern Africa by Cor Claeys, Eddy Simoen
Cover of the book Death Matters by Cor Claeys, Eddy Simoen
Cover of the book Data Analytics for Protein Crystallization by Cor Claeys, Eddy Simoen
Cover of the book Temporal Quantum Correlations and Hidden Variable Models by Cor Claeys, Eddy Simoen
Cover of the book New Knowledge in Information Systems and Technologies by Cor Claeys, Eddy Simoen
Cover of the book The Prostate Cancer Dilemma by Cor Claeys, Eddy Simoen
Cover of the book The Visual Language of Technique by Cor Claeys, Eddy Simoen
Cover of the book Full-3D Seismic Waveform Inversion by Cor Claeys, Eddy Simoen
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy