Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

Nonfiction, Science & Nature, Technology, Microwaves, Material Science
Cover of the book Metal Impurities in Silicon- and Germanium-Based Technologies by Cor Claeys, Eddy Simoen, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Cor Claeys, Eddy Simoen ISBN: 9783319939254
Publisher: Springer International Publishing Publication: August 13, 2018
Imprint: Springer Language: English
Author: Cor Claeys, Eddy Simoen
ISBN: 9783319939254
Publisher: Springer International Publishing
Publication: August 13, 2018
Imprint: Springer
Language: English

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed.

 

The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed.

 

The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

More books from Springer International Publishing

Cover of the book Seismic Evaluation and Rehabilitation of Structures by Cor Claeys, Eddy Simoen
Cover of the book Frontiers in Algorithmics by Cor Claeys, Eddy Simoen
Cover of the book Drug Abuse in Adolescence by Cor Claeys, Eddy Simoen
Cover of the book Resisting Theology, Furious Hope by Cor Claeys, Eddy Simoen
Cover of the book Hormones and the Endocrine System by Cor Claeys, Eddy Simoen
Cover of the book Selected Topics of Computational and Experimental Fluid Mechanics by Cor Claeys, Eddy Simoen
Cover of the book Health System Redesign by Cor Claeys, Eddy Simoen
Cover of the book Information and Communications Technology in Primary School Education by Cor Claeys, Eddy Simoen
Cover of the book 9th International Conference on Practical Applications of Computational Biology and Bioinformatics by Cor Claeys, Eddy Simoen
Cover of the book Silicon Light-Emitting Diodes and Lasers by Cor Claeys, Eddy Simoen
Cover of the book Atomic Particles and Atom Systems by Cor Claeys, Eddy Simoen
Cover of the book Latent Variable Analysis and Signal Separation by Cor Claeys, Eddy Simoen
Cover of the book Male Hypogonadism by Cor Claeys, Eddy Simoen
Cover of the book Digital Human Modeling. Applications in Health, Safety, Ergonomics, and Risk Management: Ergonomics and Design by Cor Claeys, Eddy Simoen
Cover of the book Teaching Narrative by Cor Claeys, Eddy Simoen
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy