Modeling Nanoscale Imaging in Electron Microscopy

Nonfiction, Science & Nature, Science, Chemistry, Analytic, Technology, Material Science
Cover of the book Modeling Nanoscale Imaging in Electron Microscopy by , Springer New York
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Author: ISBN: 9781461421917
Publisher: Springer New York Publication: March 2, 2012
Imprint: Springer Language: English
Author:
ISBN: 9781461421917
Publisher: Springer New York
Publication: March 2, 2012
Imprint: Springer
Language: English

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

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