Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

Nonfiction, Science & Nature, Technology, Nanotechnology, Science, Physics, Solid State Physics
Cover of the book Scanning Probe Microscopy by Bert Voigtländer, Springer Berlin Heidelberg
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Author: Bert Voigtländer ISBN: 9783662452400
Publisher: Springer Berlin Heidelberg Publication: February 24, 2015
Imprint: Springer Language: English
Author: Bert Voigtländer
ISBN: 9783662452400
Publisher: Springer Berlin Heidelberg
Publication: February 24, 2015
Imprint: Springer
Language: English

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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