Scanning Transmission Electron Microscopy of Nanomaterials

Basics of Imaging and Analysis

Nonfiction, Science & Nature, Science, Physics, Optics, Mechanics
Cover of the book Scanning Transmission Electron Microscopy of Nanomaterials by Nobuo Tanaka, World Scientific Publishing Company
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Author: Nobuo Tanaka ISBN: 9781783264711
Publisher: World Scientific Publishing Company Publication: August 21, 2014
Imprint: ICP Language: English
Author: Nobuo Tanaka
ISBN: 9781783264711
Publisher: World Scientific Publishing Company
Publication: August 21, 2014
Imprint: ICP
Language: English

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Contents:

  • Introduction (N Tanaka)

    Historical Survey of the Development of STEM Instruments (N Tanaka)

  • Basic Knowledge of STEM:

    • Basics of STEM (N Tanaka and K Saitoh)
    • Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
  • Theories of STEM Imaging:

    • Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
    • Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
    • Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
    • Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
  • Advanced Methods in STEM:

    • Aberration Correction in STEM (H Sawada)
    • Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
    • Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
    • Electron Tomography in STEM (N Tanaka)
    • Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
    • Recent Topics and Future Prospects in STEM (N Tanaka)

    Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.
    Key Features:

    • Most advanced; befitting beginning graduate students
    • Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
    • Spans from the basic theory to the applications of STEM
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Contents:

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