Spectroscopy of Complex Oxide Interfaces

Photoemission and Related Spectroscopies

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science
Cover of the book Spectroscopy of Complex Oxide Interfaces by , Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9783319749891
Publisher: Springer International Publishing Publication: April 9, 2018
Imprint: Springer Language: English
Author:
ISBN: 9783319749891
Publisher: Springer International Publishing
Publication: April 9, 2018
Imprint: Springer
Language: English

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. 

The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. 

The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.

More books from Springer International Publishing

Cover of the book The Dialectical Forge by
Cover of the book Gender Justice, Education and Equality by
Cover of the book The Religious Left in Modern America by
Cover of the book Universities in the Age of Reform, 1800–1870 by
Cover of the book Handbook of Bioenergy by
Cover of the book Population Health Management for Poly Chronic Conditions by
Cover of the book Purposeful Engineering Economics by
Cover of the book Advances in Nonlinear Geosciences by
Cover of the book Dynamics of Mechanical Systems with Non-Ideal Excitation by
Cover of the book Egypt in Crisis by
Cover of the book Biophotoelectrochemistry: From Bioelectrochemistry to Biophotovoltaics by
Cover of the book Quantitative Psychology Research by
Cover of the book Sensing Technology: Current Status and Future Trends II by
Cover of the book Nutrition and Health in a Developing World by
Cover of the book Molecular Pathology of Breast Cancer by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy