Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Application Software, CAD/CAM
Cover of the book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan, Springer New York
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Hao Yu, Ruijing Shen, Sheldon X.-D. Tan ISBN: 9781461407881
Publisher: Springer New York Publication: July 8, 2014
Imprint: Springer Language: English
Author: Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
ISBN: 9781461407881
Publisher: Springer New York
Publication: July 8, 2014
Imprint: Springer
Language: English

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;

  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;

  • Presents analysis of each algorithm with practical applications in the context of real circuit design;

  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;

  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;

  • Presents analysis of each algorithm with practical applications in the context of real circuit design;

  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. 

More books from Springer New York

Cover of the book Introduction to Perturbation Methods by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book In Search of William Gascoigne by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Humor and Life Stress by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Surgery of Complex Abdominal Wall Defects by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book A New Understanding of Terrorism by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book To Live and To Die: When, Why, and How by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Circumareolar Techniques for Breast Surgery by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Manual of Gynecologic Surgery by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Email and Commercial Correspondence by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Current and Future Reproductive Technologies and World Food Production by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book CMOS IC Design for Wireless Medical and Health Care by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Human and Mammalian Cytogenetics by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Handbook of Practical Immunohistochemistry by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book The Affordable Care Act as a National Experiment by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Restless Legs Syndrome/Willis Ekbom Disease by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy