Theoretical Concepts of X-Ray Nanoscale Analysis

Theory and Applications

Nonfiction, Science & Nature, Science, Other Sciences, Weights & Measures, Technology, Material Science
Cover of the book Theoretical Concepts of X-Ray Nanoscale Analysis by Ilya Feranchuk, Alexander Ulyanenkov, Andrei Benediktovich, Springer Berlin Heidelberg
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Author: Ilya Feranchuk, Alexander Ulyanenkov, Andrei Benediktovich ISBN: 9783642381775
Publisher: Springer Berlin Heidelberg Publication: September 7, 2013
Imprint: Springer Language: English
Author: Ilya Feranchuk, Alexander Ulyanenkov, Andrei Benediktovich
ISBN: 9783642381775
Publisher: Springer Berlin Heidelberg
Publication: September 7, 2013
Imprint: Springer
Language: English

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

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