VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Nonfiction, Computers, Computer Hardware, Input-Output Equipment, General Computing
Cover of the book VLSI Design and Test by , Springer Singapore
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Author: ISBN: 9789811359507
Publisher: Springer Singapore Publication: January 24, 2019
Imprint: Springer Language: English
Author:
ISBN: 9789811359507
Publisher: Springer Singapore
Publication: January 24, 2019
Imprint: Springer
Language: English

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

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