Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Nonfiction, Science & Nature, Technology, Electronics, Engineering, Computers, General Computing
Cover of the book Advances in Imaging and Electron Physics by Peter W. Hawkes, Elsevier Science
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Author: Peter W. Hawkes ISBN: 9780123813176
Publisher: Elsevier Science Publication: August 6, 2010
Imprint: Academic Press Language: English
Author: Peter W. Hawkes
ISBN: 9780123813176
Publisher: Elsevier Science
Publication: August 6, 2010
Imprint: Academic Press
Language: English

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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