by
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael
Language: English
Release Date: November 17, 2017
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...