Juan Pablo Borja: 1 book

Book cover of Dielectric Breakdown in Gigascale Electronics

Dielectric Breakdown in Gigascale Electronics

Time Dependent Failure Mechanisms

by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Language: English
Release Date: September 16, 2016

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the...
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