Dielectric Breakdown in Gigascale Electronics

Time Dependent Failure Mechanisms

Nonfiction, Science & Nature, Technology, Nanotechnology, Material Science
Cover of the book Dielectric Breakdown in Gigascale Electronics by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky ISBN: 9783319432205
Publisher: Springer International Publishing Publication: September 16, 2016
Imprint: Springer Language: English
Author: Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
ISBN: 9783319432205
Publisher: Springer International Publishing
Publication: September 16, 2016
Imprint: Springer
Language: English

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics.  Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics.  Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.

More books from Springer International Publishing

Cover of the book Tectonic Inheritance in Continental Rifts and Passive Margins by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book American Jewish Year Book 2017 by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Poverty in the United States by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Rural Health Disparities by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Seventeenth-Century Indivisibles Revisited by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Origin and Evolution of Biodiversity by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Quantum Brownian Motion Revisited by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book NSAIDs and Aspirin by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Frontline Policing in the 21st Century by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Ethical and Political Approaches to Nonhuman Animal Issues by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Doing Good Parenthood by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book The Purpose of the Business School by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Epigenetics and Neuroendocrinology by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Background Processes in the Electrostatic Spectrometers of the KATRIN Experiment by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
Cover of the book Internet of Things by Toh-Ming Lu, Juan Pablo Borja, Joel Plawsky
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy