Electromigration Modeling at Circuit Layout Level

Nonfiction, Science & Nature, Technology, Quality Control, Electronics, Circuits
Cover of the book Electromigration Modeling at Circuit Layout Level by Feifei He, Cher Ming Tan, Springer Singapore
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Author: Feifei He, Cher Ming Tan ISBN: 9789814451215
Publisher: Springer Singapore Publication: March 16, 2013
Imprint: Springer Language: English
Author: Feifei He, Cher Ming Tan
ISBN: 9789814451215
Publisher: Springer Singapore
Publication: March 16, 2013
Imprint: Springer
Language: English

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief addresses the readers to the necessity of 3D real circuit modelling in order to evaluate the EM of interconnect system in ICs, and how they can create such models for their own applications. A 3-dimensional (3D) electro-thermo-structural model as opposed to the conventional current density based 2-dimensional (2D) models is presented at circuit-layout level.

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Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief addresses the readers to the necessity of 3D real circuit modelling in order to evaluate the EM of interconnect system in ICs, and how they can create such models for their own applications. A 3-dimensional (3D) electro-thermo-structural model as opposed to the conventional current density based 2-dimensional (2D) models is presented at circuit-layout level.

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