Ellipsometry of Functional Organic Surfaces and Films

Nonfiction, Science & Nature, Science, Physics, Solid State Physics, Technology, Material Science
Cover of the book Ellipsometry of Functional Organic Surfaces and Films by , Springer Berlin Heidelberg
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Author: ISBN: 9783642401282
Publisher: Springer Berlin Heidelberg Publication: October 24, 2013
Imprint: Springer Language: English
Author:
ISBN: 9783642401282
Publisher: Springer Berlin Heidelberg
Publication: October 24, 2013
Imprint: Springer
Language: English

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

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Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

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