Metrology and Physical Mechanisms in New Generation Ionic Devices

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Nanotechnology
Cover of the book Metrology and Physical Mechanisms in New Generation Ionic Devices by Umberto Celano, Springer International Publishing
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Author: Umberto Celano ISBN: 9783319395319
Publisher: Springer International Publishing Publication: June 18, 2016
Imprint: Springer Language: English
Author: Umberto Celano
ISBN: 9783319395319
Publisher: Springer International Publishing
Publication: June 18, 2016
Imprint: Springer
Language: English

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. 

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. 

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