Noise Coupling in System-on-Chip

Nonfiction, Science & Nature, Technology, Electronics, Microelectronics, Circuits, Electricity
Cover of the book Noise Coupling in System-on-Chip by , CRC Press
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9781351642781
Publisher: CRC Press Publication: January 9, 2018
Imprint: CRC Press Language: English
Author:
ISBN: 9781351642781
Publisher: CRC Press
Publication: January 9, 2018
Imprint: CRC Press
Language: English

Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends.

More books from CRC Press

Cover of the book Chemometrics in Chromatography by
Cover of the book Vitamin C by
Cover of the book Tooth Whitening Techniques by
Cover of the book Delivery Strategies for Antisense Oligonucleotide Therapeutics by
Cover of the book Hydraulic Structures by
Cover of the book Understanding Housing Finance by
Cover of the book Handbook of Online and Near-real-time Methods in Microbiology by
Cover of the book Pollution in Tropical Aquatic Systems by
Cover of the book Organization of Prokaryotic Cell Membranes by
Cover of the book Water Distribution System Monitoring by
Cover of the book Regulation Of Serum Lipids By Physical Exercise by
Cover of the book Natural History Of Hidden Animals by
Cover of the book Innovative Developments in Design and Manufacturing by
Cover of the book Vector Analysis and Cartesian Tensors, Third edition by
Cover of the book CRC Handbook of Eicosanoids, Volume II by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy