Quantitative Data Processing in Scanning Probe Microscopy

SPM Applications for Nanometrology

Nonfiction, Science & Nature, Science, Other Sciences, Microscopes & Microscopy, Business & Finance
Cover of the book Quantitative Data Processing in Scanning Probe Microscopy by Petr Klapetek, Elsevier Science
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Petr Klapetek ISBN: 9781455730599
Publisher: Elsevier Science Publication: December 31, 2012
Imprint: William Andrew Language: English
Author: Petr Klapetek
ISBN: 9781455730599
Publisher: Elsevier Science
Publication: December 31, 2012
Imprint: William Andrew
Language: English

Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM).

Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected.

In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website.

  • Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings.
  • Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable.
  • Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available).
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM).

Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected.

In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website.

More books from Elsevier Science

Cover of the book The Brain by Petr Klapetek
Cover of the book Mergers, Acquisitions, and Other Restructuring Activities by Petr Klapetek
Cover of the book Neurology by Petr Klapetek
Cover of the book Television Versus the Internet by Petr Klapetek
Cover of the book Air Traffic Management by Petr Klapetek
Cover of the book Novel Methods to Study Interfacial Layers by Petr Klapetek
Cover of the book Eco-friendly Innovations in Electricity Transmission and Distribution Networks by Petr Klapetek
Cover of the book The Circuit Designer's Companion by Petr Klapetek
Cover of the book Marine Structural Design Calculations by Petr Klapetek
Cover of the book New Approaches for the Generation and Analysis of Microbial Typing Data by Petr Klapetek
Cover of the book Cyber Attacks by Petr Klapetek
Cover of the book Hyaluronan Signaling and Turnover by Petr Klapetek
Cover of the book Integrated Gasification Combined Cycle (IGCC) Technologies by Petr Klapetek
Cover of the book Flow Networks by Petr Klapetek
Cover of the book Atherosclerotic Plaque Characterization Methods Based on Coronary Imaging by Petr Klapetek
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy